Search Thermo Fisher Scientific
Thermo Scientific™
Spectra 300 S/TEM for Semiconductors
Catalog number: SPECTRA300
Thermo Scientific™
Spectra 300 S/TEM for Semiconductors
Catalog number: SPECTRA300
As the fastest and most reliable instrument in its class, the Thermo Scientific™ Spectra 300 Scanning/Transmission Electron Microscope (S/TEM) provides unprecedented performance for the study of semiconductor materials and semiconductor failure analysis. Insight regarding advanced products, such as 7 nm or smaller node devices, is now within your grasp thanks to the unique combination of high-brightness field emission gun (X-FEG) and easy-to-use software. With its ability to generate fast EDS maps (without any loss of spatial resolution), as well as electron energy loss spectroscopy (EELS) and low-kV analysis, this is the ideal high-end S/TEM solution for industrial applications.
Showing 1 of 1
| Catalog Number | Specifications | Unit Size | Price (USD) | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| SPECTRA300 | Each | Request A Quote | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
| |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Key Benefits:
Unprecedented performance
Answer challenging questions in the advanced production of semiconductor devices, such as 7 nm or smaller node devices.
High-brightness FEG
Two high-brightness FEG options; the standard high-brightness field emission gun (X-FEG) or the optional high-brightness cold field emission gun (XCFEG). The X-FEG is suited for optimal performance, while the XCFEG is designed for ease-of-use (facilitating STEM, EELS and low-kV analysis).
Ease of use
With a robust suite of software and hardware tools designed to improve the user experience, the Spectra 300 S/TEM ensures efficient analysis and high productivity.
Figures
Documents & Downloads
Certificates
Search by lot number or partial lot number
Frequently asked questions (FAQs)
Citations & References
Search citations by name, author, journal title or abstract text