Discover high-performance desktop SEM

Phenom ProX Specification Sheet

The Phenom ProX SEM Generation 5 is a high-performance SEM for imaging and analysis. With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Besides point analysis, the Elemental Mapping and Line Scan software allows further analysis of the distribution of elements. 

Download the Phenom ProX specification sheet and learn how to:

  • Perform enhanced imaging thanks to new electronics and improved lens
  • Analyze image materials that are very sensitive to beam damage
  • Acquire excellent SEM images even in low vacuum conditions when analyzing non-conductive samples
  • Employ a high-end Secondary Electron Detector for applications that require surface-sensitive information

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