West Coast Failure Analysis Seminar: Ask the Expert

Welcome

12:00 – 12:25 p.m.

Presented by Melissa Mullen, Thermo Fisher Scientific, Marketing Manager

Session 1: Large Volume EFA to PFA
Presentation: Lock-in thermography for fault isolation
12:25 – 12:55 p.m.
Presented by Brian Lai, Thermo Fisher Scientific, Field Applications Engineer

Presentation: Plasma FIB for Failure Analysis and Characterization

12:55 – 1:25 p.m.

Presented by Eurofins EAG Laboratories

Presentation: Multi-ion Species Plasma-FIB Use-Case for FA
1:25 pm – 2:25 pm
Presented by Adam Stokes, Product Marketing Manager 

Break

2:25 – 2:50 p.m.

Refreshments and snacks provided

Session 2: Sample Preparation
Presentation: TEM sample preparation and automated workflows
2:50 – 3:50 p.m.
Presented by David Prentice, Thermo Fisher Scientific, Field Applications Engineer

Facility Tour
3:50 – 4:30 p.m.
Presented by Eurofins EAG Laboratories

Session 3: TEM Analysis

Presentation: TEM techniques for Failure Analysis
9:00 – 9:30 a.m.
Presented by Eurofins EAG Laboratories

Presentation: Enhanced TEM workflow for Semiconductor
9:30 – 10:30 a.m.
Presented by Jared Johnson, Senior Product Specialist

Break
10:30 – 10:50 a.m.
Refreshments provided

Session 4: User Group Meeting
Special Topic, followed by roundtable discussion
Presented by Josh Sugar, Lawrence Livermore Labs
10:50 – 11:20 a.m.

Special Topic, followed by roundtable discussion
Presented by Bryan Tracy, IBSS
11:20 – 11:50 a.m.

Closing remarks
Presented by Melissa Mullen
11:50 a.m. – 12:00 p.m.

Lunch
12:00 – 1:00 p.m.

Nearby Bay Area locations for Thermo Fisher and EAG Laboratories will be available for 1-hour informational tours before and after the seminar sessions. Sign up by checking these boxes while registering!

Tuesday, June 3
9:00 a.m. | 3400 W Warren Ave, Fremont, CA 94538
Presented by Thermo Fisher Scientific

Wednesday, June 4
1:30 p.m. | 810 Kifer Road, Sunnyvale, CA 94086
Presented by Eurofins EAG Laboratories