Search Thermo Fisher Scientific
Date/Time: May 14, 8 a.m. to 5 p.m. | May 15, 2024, 8 a.m. to 2 p.m.
Thermo Fisher Scientific Americas NanoPort
5350 NE Dawson Creek Dr.
Hillsboro, OR 97124, United States
Join us at our North American NanoPort for a free two-day workshop on advanced imaging and characterization techniques for current and future battery technology. Our applications specialists will be on hand to demonstrate our Inert Gas Sample Transfer (IGST) Workflow on a variety of instruments, including the Thermo Scientific CleanMill Broad Ion Beam System, Apreo 2 Scanning Electron Microscope, Helios Hydra DualBeam FIB-SEM, and Talos G2 S/TEM.
The IGST Workflow uses the Thermo Scientific CleanConnect Sample Transfer System to prevent air and moisture contamination when preparing and transferring samples. This complete protection supports high-end materials characterization by making it possible to observe even your most delicate samples in their native state.
Plus, this workshop is your chance to learn more about:
- Imaging beam-sensitive materials with the Thermo Scientific Spectra Ultra S/TEM
- Imaging and visualization for battery structural analysis with Thermo Scientific Avizo Software
- Detecting metal impurities with the Thermo Scientific Phenom ParticleX Desktop SEM and EDS
- The benefits of electron and ion microscopy, surface analysis, and data analysis and visualization techniques
Attendance is free and includes continental breakfast, lunch, and an appreciation event on the first evening. Please list any dietary requirements in the registration form.
Hotel accommodation is not included.
About the host:
Brandon Van Leer, Product Marketing Manager, Thermo Fisher Scientific
Brandon has held a variety of positions since joining Thermo Fisher Scientific in 2004, including senior applications engineer, applications manager, and product marketing manager. He currently works on emerging analytical instruments for use in battery and clean energy applications. Previously, he primarily focused on materials characterization and developing electronic materials and polymers. Brandon has over 27 years of experience with analytical techniques, including 20 years of exploring SEM and FIB. His current research interests include developing applications for inert gas sample transfer, cryo-plasma FIB, and multi-ion source plasma FIB for air- and beam-sensitive materials. He received both a BS in physics and an MS in electrical engineering from Oregon State University. He is a member of MSA, MRS, and IEEE.